发明名称 |
Dram memory cell has select transistor with a gate electrode surrounding at least two sides of the channel and a memory capacitor |
摘要 |
<p>A DRAM memory cell comprises a select transistor (200) on a semiconductor substrate with source/ drain electrodes (201,202), a channel layer (203), an isolated gate electrode, a memory capacitor (100) with two electrodes, one connected to the source/drain and a rear substrate electrode. The gate electrode surrounds opposite sides of the channel. An independent claim is also included for a production process for the above DRAM.</p> |
申请公布号 |
DE10320239(A1) |
申请公布日期 |
2004.12.02 |
申请号 |
DE2003120239 |
申请日期 |
2003.05.07 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
LUVKEN, JOHANNES;HOFMANN, FRANZ;RISCH, LOTHAR;ROESNER, WOLFGANG;SPECHT, MICHAEL;SCHLOESSER, TILL;MANGER, DIRK |
分类号 |
H01L21/8238;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108;H01L21/824 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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