发明名称 Dram memory cell has select transistor with a gate electrode surrounding at least two sides of the channel and a memory capacitor
摘要 <p>A DRAM memory cell comprises a select transistor (200) on a semiconductor substrate with source/ drain electrodes (201,202), a channel layer (203), an isolated gate electrode, a memory capacitor (100) with two electrodes, one connected to the source/drain and a rear substrate electrode. The gate electrode surrounds opposite sides of the channel. An independent claim is also included for a production process for the above DRAM.</p>
申请公布号 DE10320239(A1) 申请公布日期 2004.12.02
申请号 DE2003120239 申请日期 2003.05.07
申请人 INFINEON TECHNOLOGIES AG 发明人 LUVKEN, JOHANNES;HOFMANN, FRANZ;RISCH, LOTHAR;ROESNER, WOLFGANG;SPECHT, MICHAEL;SCHLOESSER, TILL;MANGER, DIRK
分类号 H01L21/8238;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108;H01L21/824 主分类号 H01L21/8238
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