| 摘要 |
A scanning optical system using a short-wavelength light of 500 nm or less uses a reflecting mirror having a higher absolute reflectivity and having reduced wavelength and angle dependences. Divergent ray of light emitted from a semiconductor laser is converted into an approximately parallel light beam by a collimator lens and the diameter of the light flux is reduced by an aperture before travel to a polygon mirror. The light beam from the polygon mirror passes through scanning lenses to form a small spot at any point in the entire scanning area. The semiconductor laser is a gallium nitride semiconductor laser having an oscillation wavelength of 408 nm. The polygon mirror has such a characteristic that, if the complex refractive index N of a metallic film contributing to a reflection characteristic of the reflecting mirror is defined as N(lambda)=n(lambda)-ik(lambda), then k(lambda)>{square root}{square root over ((-n(lambda)<2>+18n(lambda)-1))} is satisfied.
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