发明名称 Apparatus and method for loop-back testing in a system test/emulation environment
摘要 In a test configuration in which an emulator unit is separated from a target processor under test, the effect of the emulator cable (and pod unit) on the distortion of the signals returned from the processor can be determined by a switch in which signals from the emulator unit are applied to conductor in which signals are returned to the emulator unit, the switch being located in the vicinity of the target processor. In certain test environments, addition switches can be provided proximate the target processor to isolate the emulator cable conductor signals from the target processor.
申请公布号 US2004239635(A1) 申请公布日期 2004.12.02
申请号 US20040851533 申请日期 2004.05.21
申请人 LERNER RONALD L.;LARSON LEE A. 发明人 LERNER RONALD L.;LARSON LEE A.
分类号 G09G5/00;H04L12/26;(IPC1-7):G09G5/00 主分类号 G09G5/00
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