发明名称 Semiconductor dynamic quantity sensor
摘要 In a semiconductor acceleration sensor (S1), above one side of a first silicon substrate (10) made of a semiconductor and serving as a fixed electrode (11), a moving electrode (20) made of a semiconductor and displaceable in the thickness direction of the first silicon substrate (10) is disposed apart from and facing the first silicon substrate (10). An applied acceleration is detected on the basis of capacitance changes between the moving electrode (20) and the face of the first silicon substrate (10) accompanying displacement of the moving electrode (20). A space and an electrically insulative insulating layer (13) having a relative permittivity larger than that of air are interposed between the moving electrode (20) and the face of the first silicon substrate (10), side by side in the direction in which the moving electrode (20) and the first silicon substrate (10) are apart.
申请公布号 US2004237652(A1) 申请公布日期 2004.12.02
申请号 US20040856858 申请日期 2004.06.01
申请人 DENSO CORPORATION 发明人 SAKAI MINEKAZU
分类号 G01P15/125;H01L29/84;(IPC1-7):G01P15/125 主分类号 G01P15/125
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