发明名称 Method for processing soi substrate
摘要 A method for processing an SOI substrate composed of a backing layer comprising a semiconductor substrate, an insulating layer laminated on the upper surface of the backing layer, a thin semiconductor film layer laminated on the upper surface of the insulating layer, and circuits formed on the face of the thin semiconductor film layer, the method including: a grinding step of grinding the backing layer so as to remain with a predetermined thickness; and an etching step of removing the backing layer, which has been formed to the predetermined thickness by the grinding step, by chemical etching to expose the insulating layer.
申请公布号 US2004241961(A1) 申请公布日期 2004.12.02
申请号 US20040489738 申请日期 2004.03.16
申请人 TAKAHASHI TOSHIAKI;ARAI KAZUHISA 发明人 TAKAHASHI TOSHIAKI;ARAI KAZUHISA
分类号 H01L27/12;B24B7/22;H01L21/00;H01L21/02;H01L21/306;H01L21/76;H01L21/762;(IPC1-7):H01L21/76 主分类号 H01L27/12
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