发明名称 |
SEMICONDUCTOR IC DEVICE WITH PHASE SHIFT MATERIAL LAYER SHARED WITH FIELD EFFECT TRANSISTORS |
摘要 |
<p>PURPOSE: A semiconductor IC(Integrated Circuit) device is provided to restrain the non-uniformity of electrical properties and the degradation of reliability by sharing a phase shift material layer with FETs(Field Effect Transistors) and forming a plate node electrode on the phase shift material layer. CONSTITUTION: A semiconductor IC device includes a plurality of memory cells. Each memory cell includes a resistive element(R) and FETs(QM) electrically connected with the resistive element on a semiconductor substrate(1). The resistive element is composed of a first electrode layer(21), a phase shift material layer(CG), and a second electrode layer(24). The resistive element is used for connecting electrically a common power source terminal to at least two FETs of the memory cell.</p> |
申请公布号 |
KR20040100867(A) |
申请公布日期 |
2004.12.02 |
申请号 |
KR20040013903 |
申请日期 |
2004.03.02 |
申请人 |
HITACHI ULSI SYSTEMS CO., LTD.;KABUSHIKI KAISHA HITACHI SEISAKUSHO |
发明人 |
KUROTSUCHI, KENZO;MATSUOKA, HIDEYUKI;TAKAURA, NORIKATSU;TERAO, MOTOYASU;YAMAUCHI, TSUYOSHI |
分类号 |
H01L27/10;H01L27/105;H01L27/115;H01L27/24;H01L29/02;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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