发明名称 SEMICONDUCTOR IC DEVICE WITH PHASE SHIFT MATERIAL LAYER SHARED WITH FIELD EFFECT TRANSISTORS
摘要 <p>PURPOSE: A semiconductor IC(Integrated Circuit) device is provided to restrain the non-uniformity of electrical properties and the degradation of reliability by sharing a phase shift material layer with FETs(Field Effect Transistors) and forming a plate node electrode on the phase shift material layer. CONSTITUTION: A semiconductor IC device includes a plurality of memory cells. Each memory cell includes a resistive element(R) and FETs(QM) electrically connected with the resistive element on a semiconductor substrate(1). The resistive element is composed of a first electrode layer(21), a phase shift material layer(CG), and a second electrode layer(24). The resistive element is used for connecting electrically a common power source terminal to at least two FETs of the memory cell.</p>
申请公布号 KR20040100867(A) 申请公布日期 2004.12.02
申请号 KR20040013903 申请日期 2004.03.02
申请人 HITACHI ULSI SYSTEMS CO., LTD.;KABUSHIKI KAISHA HITACHI SEISAKUSHO 发明人 KUROTSUCHI, KENZO;MATSUOKA, HIDEYUKI;TAKAURA, NORIKATSU;TERAO, MOTOYASU;YAMAUCHI, TSUYOSHI
分类号 H01L27/10;H01L27/105;H01L27/115;H01L27/24;H01L29/02;(IPC1-7):H01L27/10 主分类号 H01L27/10
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