Method of dynamically displaying a scattering vector of X-ray diffraction

摘要

The method involves displaying a dynamic motion and tracks of a tip location of a scattering vector of X-ray diffraction under changing measuring conditions of the diffraction on a display screen. The screen represents reciprocal space of a sample crystal. A change of measuring conditions is acquired from a measuring-condition setting device. The tracks are displayed along with information about an X-ray diffraction intensity.