发明名称 Method of manufacturing a wafer
摘要 The present invention relates to a method of manufacturing a wafer in which a heterogeneous material compound is detached at a pre-determined detachment area of the compound, and the compound is subject to a thermal treatment. It is the object of the present invention to provide an easy and effective method of detachment a heterogeneous material compound with a reduced risk of an undefined breaking of the compound. The object is solved by a method wherein the thermal treatment includes annealing the compound, where the annealing is stopped before a detachment of the compound, and an irradiation of the compound with photons in order to obtain a detachment of the compound at the pre-determined detachment area.
申请公布号 US2004241960(A1) 申请公布日期 2004.12.02
申请号 US20030716900 申请日期 2003.11.18
申请人 MAURICE THIBAUT;CAYREFOURCQ IAN;FOURNEL FRANCK 发明人 MAURICE THIBAUT;CAYREFOURCQ IAN;FOURNEL FRANCK
分类号 H01L21/02;H01L21/265;H01L21/762;H01L27/12;(IPC1-7):H01L21/30 主分类号 H01L21/02
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