发明名称 MEASUREMENT OF POINT CONTACT ANDREEV-REFLECTION CHARACTERISTICS OF HALF-METALLIC THIN FILMS
摘要 An apparatus for measuring spin polarization via Point Contact Andreev Reflection (PCAR) at a magnet-superconductor junction, with variable magnetic fields and temperature control. A cryostat probe investigates superconducting energy gap and Andreev reflection in superconductor-half metal junctions, in a wide range of magnetic fields and temperature form 2K-300K. The cryostat probe is integrated with a commercial physical properties measurement system. The measurement probe includes a rotary-translation stage with coarse and fine screws the tenable a user to make point contacts in a cryogenic, evacuated environment where the point contact junction can be controlled at room temperature by turning a knob. Copper wires are connected as electrical leads from an aluminum housing, descend down to a copper housing for measurement, when contact is made by tip with a half-metal sample, such as CrO2: External current and voltage meters measure the current-voltage characteristics and data acquisition is performed using computer interface.
申请公布号 WO2004079340(A3) 申请公布日期 2004.12.02
申请号 WO2004US06219 申请日期 2004.03.01
申请人 UNIVERSITY OF SOUTH FLORIDA;HARIHARAN, SRIKANTH;SANDERS, JEFF, T. 发明人 HARIHARAN, SRIKANTH;SANDERS, JEFF, T.
分类号 G01R33/12 主分类号 G01R33/12
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