发明名称 |
MEASUREMENT OF POINT CONTACT ANDREEV-REFLECTION CHARACTERISTICS OF HALF-METALLIC THIN FILMS |
摘要 |
An apparatus for measuring spin polarization via Point Contact Andreev Reflection (PCAR) at a magnet-superconductor junction, with variable magnetic fields and temperature control. A cryostat probe investigates superconducting energy gap and Andreev reflection in superconductor-half metal junctions, in a wide range of magnetic fields and temperature form 2K-300K. The cryostat probe is integrated with a commercial physical properties measurement system. The measurement probe includes a rotary-translation stage with coarse and fine screws the tenable a user to make point contacts in a cryogenic, evacuated environment where the point contact junction can be controlled at room temperature by turning a knob. Copper wires are connected as electrical leads from an aluminum housing, descend down to a copper housing for measurement, when contact is made by tip with a half-metal sample, such as CrO2: External current and voltage meters measure the current-voltage characteristics and data acquisition is performed using computer interface. |
申请公布号 |
WO2004079340(A3) |
申请公布日期 |
2004.12.02 |
申请号 |
WO2004US06219 |
申请日期 |
2004.03.01 |
申请人 |
UNIVERSITY OF SOUTH FLORIDA;HARIHARAN, SRIKANTH;SANDERS, JEFF, T. |
发明人 |
HARIHARAN, SRIKANTH;SANDERS, JEFF, T. |
分类号 |
G01R33/12 |
主分类号 |
G01R33/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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