发明名称 Field effect transistor and method of fabrication
摘要 The present invention is a novel field effect transistor having a channel region formed from a narrow bandgap semiconductor film formed on an insulating substrate. A gate dielectric layer is formed on the narrow bandgap semiconductor film. A gate electrode is then formed on the gate dielectric. A pair of source/drain regions formed from a wide bandgap semiconductor film or a metal is formed on opposite sides of the gate electrode and adjacent to the low bandgap semiconductor film.
申请公布号 US6825506(B2) 申请公布日期 2004.11.30
申请号 US20020306640 申请日期 2002.11.27
申请人 INTEL CORPORATION 发明人 CHAU ROBERT S.;BARLAGE DOULGAS;JIN BEEN-YIH
分类号 H01L21/336;H01L29/45;H01L29/49;H01L29/78;H01L29/786;(IPC1-7):H01L31/072 主分类号 H01L21/336
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