发明名称 Apparatus and method for a radiation resistant latch with integrated scan
摘要 According to one form, a latch has an output node and sublatches. The sublatches each have an output node coupled to input circuitry and feedback circuitry coupled to the sublatch's output node for reinforcing an output signal of the sublatch. The sublatches are operable to receive a data signal at their respective input circuitry and to generate output signals on their respective output nodes. At least one sublatch output node is coupled to the latch output node. The output nodes of other ones of the sublatches are connected in the latch such that if any one of the sublatches is subjected to a radiation induced erroneous change of state the output signals of the other sublatches reduce an effect of the change on the latch output signal. The latch also includes a number of scanning-mode control switches coupled to ones of the sublatches for scanning data in or out.
申请公布号 US6825691(B1) 申请公布日期 2004.11.30
申请号 US20030455163 申请日期 2003.06.05
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHU SAM GAT-SHANG;KLIM PETER JUERGEN;LEE MICHAEL JU HYEOK;PAREDES JOSE ANGEL
分类号 G11C11/412;(IPC1-7):H03K19/173 主分类号 G11C11/412
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