发明名称 Twin P-well CMOS imager
摘要 A CMOS imager which includes a substrate voltage pump to bias a doped area of a substrate to prevent leakage into the substrate from the transistors formed in the doped area. The invention also provides a CMOS imager where a photodetector sensor array is formed in a first p-well and readout logic is formed in a second p-well. The first p-well can be selectively doped to optimize cross-talk, collection efficiency and transistor leakage, thereby improving the quantum efficiency of the sensor array while the second p-well can be selectively doped and/or biased to improve the speed and drive of the readout circuitry.
申请公布号 US6825878(B1) 申请公布日期 2004.11.30
申请号 US19980207138 申请日期 1998.12.08
申请人 MICRON TECHNOLOGY, INC. 发明人 RHODES HOWARD E.
分类号 H01L27/00;H01L27/146;H01L29/768;H01L29/94;H04N5/335;(IPC1-7):H04N5/335 主分类号 H01L27/00
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