发明名称 ION SOURCE PROVIDING RIBBON BEAM WITH CONTROLLABLE DENSITY PROFILE
摘要 An ion source is disclosed for ion implantation applications, having control apparatus for selectively adjusting a density profile associated with an elongated ion beam being extracted from a plasma confinement chamber. The control apparatus comprises a plurality of magnet pairs proximate an elongated extraction exit through which a ribbon beam is extracted from the ion source, with the magnet pairs individually comprising upper and lower electro-magnets disposed above and below the extraction exit opening to provide adjustable magnetic fields in a pre-extraction region so as to adjust the density profile of an extracted ribbon beam.
申请公布号 KR20040099468(A) 申请公布日期 2004.11.26
申请号 KR20047017418 申请日期 2003.04.29
申请人 发明人
分类号 H01J27/16;H01J27/00;H01J27/06;H01J37/04;H01J37/08;H01J37/317 主分类号 H01J27/16
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