发明名称 Interconnect structures in a semiconductor device and processes of formation
摘要 Processes for fabricating a semiconductor device are described herein. In one aspect of the invention, an exemplary process includes forming an interface layer overlying the device substrate, forming a silver layer overlying the interface layer, annealing the substrate to form an intermetallic layer between the silver layer and the interface layer, the silver layer is in intimate contact with the intermetallic layer, and forming a protection layer overlying the silver layer. Other interconnect structures and processes are also described.
申请公布号 US7033930(B2) 申请公布日期 2006.04.25
申请号 US20030648950 申请日期 2003.08.26
申请人 INTEL CORPORATION 发明人 KOZHUKH MICHAEL;RASHKOVSKIY OLEG
分类号 H01L21/4763;H01L21/285;H01L21/768;H01L23/532 主分类号 H01L21/4763
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