发明名称 METHOD AND APPARATUS FOR TESTING VOLTAGE EQUALIZER CIRCUIT
摘要 PROBLEM TO BE SOLVED: To accurately evaluate the characteristics of a voltage equalizer circuit (including dynamic characteristics) by facilitating and speeding up test preparation, raising the reproductivity and reliability of a test result, and reflecting the performance of a storage element. SOLUTION: When evaluating characteristics of a voltage equalizer circuit M that equalizes terminal voltages Ea- of a plurality of storage elements Ba- connected in series, each of the storage elements Ba- is applied with a fluctuation factor of the terminal voltages Ea- in a pseudo manner, and the voltage equalizer circuit M acts on each storage elements Ba- which is applied with the fluctuation factor. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004336939(A) 申请公布日期 2004.11.25
申请号 JP20030131931 申请日期 2003.05.09
申请人 FUJI HEAVY IND LTD 发明人 YASUZAWA SEIICHI
分类号 H02J7/02;H01M10/44;(IPC1-7):H02J7/02 主分类号 H02J7/02
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