发明名称 Rückseitenkontakt für einen Halbleiterkörper
摘要 A metallising process, esp. alloying, for a semiconductor (1) comprises applying a first metal (2), a barrier (5) and a second metal (4), the barrier comprising TiWN. The second metal is a eutecticum, e.g. Au-Ge. Application of the barrier and of the second metal occurs in one-step, pref. application of first and second metals and barrier occurs in one step. An adhesive agent (6), e.g. Ti, can be applied between the barrier and the second metal. USE/ADVANTAGE - For semiconductor chips, esp. III-V semiconductors and those used in optoelectronics, e.g. IRED's. The process is simple and economical.
申请公布号 DE4129654(B4) 申请公布日期 2004.11.25
申请号 DE19914129654 申请日期 1991.09.06
申请人 SIEMENS AG 发明人 NIRSCHL, ERNST;LANG, GISELA
分类号 H01L23/532;(IPC1-7):H01L21/283;H01L21/60;C23C14/34 主分类号 H01L23/532
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