发明名称 Cleaning gas for semiconductor production equipment and cleaning method using the gas
摘要 The present invention provides a cleaning gas for semiconductor or equipment for producing semiconductor or liquid crystal, comprising a fluorine gas containing 1 vol % or less of oxygen and/or oxygen-containing compound. The cleaning gas of the present invention enables an efficient production process of semiconductor device with a high etching rate to improve the cleaning efficiency which ensures excellent cost performance.
申请公布号 US2004231695(A1) 申请公布日期 2004.11.25
申请号 US20030250924 申请日期 2003.07.08
申请人 OHNO HIROMOTO;OHI TOSHIO 发明人 OHNO HIROMOTO;OHI TOSHIO
分类号 B08B7/00;C23C16/44;H01L21/3065;H01L21/311;H01L21/3213;(IPC1-7):B08B7/00 主分类号 B08B7/00
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