发明名称 METHOD AND DEVICE FOR CLEAVING WAFER
摘要 PROBLEM TO BE SOLVED: To satisfactorily perform a cleavage in a manufacturing process in which a compound semiconductor wafer is chipped. SOLUTION: A wafer cleaning device comprises a scribing mechanism 50 for scribing the wafer W; a wafer retention mechanism 20 that has a placement surface for placing the wafer W and retains the wafer W while one end projects outside the placement surface; a stress application mechanism 60 coming into contact with the projection site of the wafer W for pressing to apply bending stress; and flexible sheet materials 27 and 69 interposed between the placement surface and the wafer W, and between the stress application mechanism 60 and the wafer W, respectively. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004335930(A) 申请公布日期 2004.11.25
申请号 JP20030132917 申请日期 2003.05.12
申请人 JUKI CORP 发明人 TAKAHARA TOSHIAKI;TAUCHI TSUKASA;NAKAMURA MASAO
分类号 H01L21/301;(IPC1-7):H01L21/301 主分类号 H01L21/301
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