发明名称 BEND TESTER
摘要 PROBLEM TO BE SOLVED: To protect a deflectometer without increasing the size of an apparatus. SOLUTION: A bend load is applied to a test piece TP supported between supports 8. The deflection meter 10 is arranged directly below the test piece TP to measure the deflection of the test piece TP. The deflectometer 10 is elevated and lowered by an elevation cylinder 11 between a measurement position and a retract position. When the deflectometer 10 detects that the test piece has been deflected at least by a specific amount, the deflectometer 10 is evacuated to a retract position. A protection plate 12 is turned interlocked with the fall operation of the deflectometer 10 to take a horizontal attitude to protect the deflectometer 10. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004333193(A) 申请公布日期 2004.11.25
申请号 JP20030126350 申请日期 2003.05.01
申请人 SHIMADZU CORP 发明人 UEDA AKIO
分类号 G01N3/20;G01N3/32;(IPC1-7):G01N3/20 主分类号 G01N3/20
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