发明名称 METHOD AND APPARATUS FOR TESTING DRIVER CIRCUIT OF AMOLED
摘要 <P>PROBLEM TO BE SOLVED: To provide a method and an apparatus for testing a plurality of driver circuits of an AMOLED (active matrix organic light-emitting diode) before inserting OLEDs (organic light-emitting diodes) are implanted. <P>SOLUTION: The method and the apparatus select one specific driver circuit to be tested and dispose a conductive sheet above the array glass of the OLED to form a capacitor. THe AMOLED has a plurality of driver circuits used for driving the plurality of OLEDs. The AMOLED contains, in addition, scanning line, data line, power line and array glass. The scanning line transmits a signal to each driver circuit and is constituted so as to make the signal enable or disable. The data line, after inserting the OLED, transmits another signal to the driver circuit, drives the OLED and allows the same to emit light. The power source line is constituted so as to supply electric power to all of the driver circuits. The array glass, that is, the surface of semiconductor is constituted so as to retain the driver circuits. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004334186(A) 申请公布日期 2004.11.25
申请号 JP20040117568 申请日期 2004.04.13
申请人 TOPPOLY OPTOELECTRONICS CORP 发明人 TSAI SHAN-HUNG;SUN MING-HSIEN;SHIH AN
分类号 H05B33/12;G09G3/00;G09G3/20;G09G3/30;G09G3/32;G11C29/02;H01L51/50 主分类号 H05B33/12
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