发明名称 Semiconductor device and method for manufacturing the same
摘要 A memory cell capacitor (C3) of a DRAM is formed by use of a MIM capacitor which uses as its electrode a metal wiring line of the same layer (M3) as metal wiring lines within a logic circuit (LOGIC), thereby enabling reduction of process costs. Higher integration is achievable by forming the capacitor using a high dielectric constant material and disposing it above a wiring layer in which bit lines (BL) are formed. In addition, using 2T cells makes it possible to provide a sufficient signal amount even when letting them operate with a low voltage. By commonizing the processes for fabricating capacitors in analog (ANALOG) and memory (MEM), it is possible to realize a semiconductor integrated circuit with the logic, analog and memory mounted together on one chip at low costs.
申请公布号 US2004232497(A1) 申请公布日期 2004.11.25
申请号 US20040488401 申请日期 2004.06.24
申请人 AKIYAMA SATORU;WATANABE TAKAO;MATSUI YUICHI;HIRATANI MASAHIKO 发明人 AKIYAMA SATORU;WATANABE TAKAO;MATSUI YUICHI;HIRATANI MASAHIKO
分类号 H01L21/8239;H01L21/8242;H01L23/522;H01L27/10;H01L27/105;H01L27/108;H01L27/115;(IPC1-7):H01L29/76 主分类号 H01L21/8239
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