发明名称 Reverse electroplating for damascene conductive region formation
摘要 A method of removing excess conductive material over a patterned insulating layer by reverse electroplating. A semiconductor wafer is submerged in an electroplating solution, and the semiconductor wafer functions as an anode in the reverse electroplating process. Bulk conductive material from the wafer surface is deposited to a cathode that is also submerged in the electroplating solution. Damascene conductive regions may be formed using the reverse electroplating process without causing damage to the top surface of the first insulating layer or causing dishing or erosion of top surface of the conductive material.
申请公布号 US2004235297(A1) 申请公布日期 2004.11.25
申请号 US20030444440 申请日期 2003.05.23
申请人 LIN BIH-TIAO 发明人 LIN BIH-TIAO
分类号 H01L21/768;(IPC1-7):H01L21/44;H01L21/476 主分类号 H01L21/768
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