发明名称 Vorrichtung zum Polieren
摘要 The polishing apparatus (100) comprises a turn table (10), which polishes a semiconductor wafer (2), and a holding and pressing part (20), which holds and presses the semiconductor wafer (2) against a polishing surface (12a) of the turn table (10). The holding and pressing part (20) transmits a force from an air bag (62) to the semiconductor wafer (2) via a pressurized fluid layer (L) to thereby press the semiconductor wafer (2) against the polishing surface (12a) via the pressurized fluid layer (L), so that the semiconductor wafer (2) can be polished. Thereby, it is possible to uniformly polish the semiconductor wafer (2). <IMAGE>
申请公布号 DE69827062(D1) 申请公布日期 2004.11.25
申请号 DE1998627062 申请日期 1998.04.02
申请人 TOKYO SEIMITSU CO. LTD., MITAKA 发明人 NUMOTO, MINORU;INABA, TAKAO;SAKAI, KENJI;TERASHITA, HISASHI;SATOH, MANABU
分类号 B24B37/04;B24B37/30;B24B49/16;(IPC1-7):B24B37/04 主分类号 B24B37/04
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