| 摘要 |
A method of generating digital test sets for testing a number of wiring interconnects is described. Each test set defines a number of test patterns for application to the wiring interconnects in parallel and a number of code words for application to respective wiring interconnects. Each pair of consecutive test patterns defines a transition distance which is related to a total number of bit value transitions of consecutive bits in the code words forming the pair of test patterns, and each test set has a total transition distance equal to the sum of the transition distances of said pairs of test patterns in the test set concerned. The method comprises generating a first test set in which the number of code words is greater than or equal to the number of wiring interconnects; and generating a second test set from the first test set, the number of test patterns in the second test set being equal to the number of test patterns in the first test set, and the total transition distance of the second test set being lower than that of the first test set. <IMAGE>
|
