发明名称 METHOD FOR X-RAY FLUORESCENT ANALYSIS OF ELEMENTAL COMPOSITION OF SUBSTANCE
摘要 FIELD: technology for elemental analysis of substances. ^ SUBSTANCE: method includes irradiation of analyzed probes and comparison standard samples by x-ray tube radiation, in spectrum of which characteristic lines are present having wave length lambda less than 1A0, registration of intensiveness of non-coherently dispersed radiation of x-ray tube anode nnc, analytical lines of determined nA and impeding nM and elements, graduation, for which a linear connection is determined between auxiliary analytical parameter R1 to intensiveness of analytical lines of determined element nA and impeding elements nM. During graduation and determination of parameters and coefficients for calculating auxiliary analytical parameter R1, considering its dependence from intensiveness of non-coherently dispersed radiation nnc and non-linearity of its dependence from intensiveness of analytical lines of determined nA, impeding nM and non-coherently dispersed radiation nnc. Additional constant proportion coefficients bnc, dA, dM, dnc are determined in additional members, which are respectively proportional to intensiveness of non-coherently dispersed radiation nnc and square values of intensiveness of analytical lines of determined (nA)2, impeding (nM)2 and non-coherently dispersed radiation (nnc)2, while auxiliary analytical parameter R1 is determined with consideration of these additional coefficients from formula ^ and calculation of amount of determined element in analyzed sample from formula . ^ EFFECT: simplified analysis, higher trustworthiness of analysis. ^ 4 dwg
申请公布号 RU2240543(C2) 申请公布日期 2004.11.20
申请号 RU20020127845 申请日期 2002.10.17
申请人 发明人 MAKAROVA T.A.;BAKHTIAROV A.V.;ZAJTSEV V.A.
分类号 G01N23/223 主分类号 G01N23/223
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