发明名称 |
BURN-IN TEST APPARATUS HAVING CONNECTOR GUIDE PREVENTING DAMAGE OF CONNECTOR |
摘要 |
PURPOSE: A burn-in test apparatus having a connector guide is provided to prevent damage of a connector and a slot and breaking or bending of a pin within the slot, thereby enhancing reliability and productivity of the burn-in test apparatus. CONSTITUTION: Plural sockets are mounted to a burn-in board. The burn-in board is inserted to a slot. Plural pins are mounted to inside of the slot. A connector guide(50) protects the slot and guides the connector of the burn-in board. The connector guide has a distance(b) capable of protecting four pins or more within the slot. The width of a guide member(52) is wider than that of the slot. The guide member is inclined toward its center portion with a constant angle and the inclined corner portion is cut.
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申请公布号 |
KR100459039(B1) |
申请公布日期 |
2004.11.19 |
申请号 |
KR19970040671 |
申请日期 |
1997.08.25 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JIN, SEONG GYU;KIM, TAE YUN |
分类号 |
H01R43/00;(IPC1-7):H01R43/00 |
主分类号 |
H01R43/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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