发明名称 BURN-IN TEST APPARATUS HAVING CONNECTOR GUIDE PREVENTING DAMAGE OF CONNECTOR
摘要 PURPOSE: A burn-in test apparatus having a connector guide is provided to prevent damage of a connector and a slot and breaking or bending of a pin within the slot, thereby enhancing reliability and productivity of the burn-in test apparatus. CONSTITUTION: Plural sockets are mounted to a burn-in board. The burn-in board is inserted to a slot. Plural pins are mounted to inside of the slot. A connector guide(50) protects the slot and guides the connector of the burn-in board. The connector guide has a distance(b) capable of protecting four pins or more within the slot. The width of a guide member(52) is wider than that of the slot. The guide member is inclined toward its center portion with a constant angle and the inclined corner portion is cut.
申请公布号 KR100459039(B1) 申请公布日期 2004.11.19
申请号 KR19970040671 申请日期 1997.08.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JIN, SEONG GYU;KIM, TAE YUN
分类号 H01R43/00;(IPC1-7):H01R43/00 主分类号 H01R43/00
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