发明名称 |
NANOPARTICLE POLYMER FOR RESIST COMPRISING RANDOM COPOLYMER OF TWO, THREE OR FOUR KINDS OF MONOMERS TO IMPROVE LINE-EDGE ROUGHNESS |
摘要 |
PURPOSE: A nanoparticle polymer for resist is provided, to obtain a resist having a pattern of micro-width from submicrometers to several tens nm, to improve line-edge roughness and to increase etching resistance. CONSTITUTION: The nanoparticle polymer is crosslinked from a random copolymer of two, three or four kinds of monomers and is represented by the formula 1, wherein a monomer capable of being used as an acid-labile monomer is represented by the formula 2 and a monomer capable of being used as an adhesion monomer is represented by the formula 6. In the formula 2, R is an alkyl group, an aryl group or other groups, and X is an arbitrary substituent; and in the formula 6, Y is H or a C1-C3 linear or branched alkyl group; and R66 is a C0-C5 linear, branched or cyclic alkyl group.
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申请公布号 |
KR20040097671(A) |
申请公布日期 |
2004.11.18 |
申请号 |
KR20030030020 |
申请日期 |
2003.05.12 |
申请人 |
SUH, DONG HACK |
发明人 |
CHOI, MYEON GIL;KIM, JONG GYU;LEE, JI YUN;LEE, SANG MIN;PARK, GYEONG SEON;SUH, DONG HACK |
分类号 |
G03F7/004;(IPC1-7):G03F7/004 |
主分类号 |
G03F7/004 |
代理机构 |
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地址 |
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