| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To more securely detect stack failure of a position sensor, and more correctly perform control for detection of stack failure. <P>SOLUTION: An absolute value of difference between a total of sensor voltage values at a first and a second IC's 4a and 4b comprising Hall IC's and a total of sensor voltage values at a first and a second IC's 4a and 4b in normal time is compared with a preset reference value A. Input and output characteristics of the first and the second IC's 4a and 4b have inverse linear inclination to each other. Above totals are varied in accordance with the Hall IC's having stack failure, and above difference is also varied in accordance with the Hall IC's having stack failure. Stack failure at the first and the second IC's 4a and 4b can thus be securely detected. The Hall IC, that is the position sensor, having the stack failure can also be simply and securely detected. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
