| 摘要 |
PROBLEM TO BE SOLVED: To provide a flaw detecting method capable of determining flaws on a master photosensitive section and a slave photosensitive section arranged on each pixel in a wide dynamic range solid-state image pickup device, and to provide a pixel defect detecting device and a digital camera. SOLUTION: The pixel defect inspection device 10 compares master photosensitive section data with a predetermined threshold (S106) to perform either of determinations that the master photosensitive section has flaws (S108) or that it has no flaw (S110). In the case of the determination that the master photosensitive section has no flaw, the device 10 compares slave photosensitive section data with the master photosensitive section data using a sensitivity ratio of the master and slave photosensitive sections (S112) to perform either of determinations that the slave photosensitive section has flaws (S114) or that it has no flaw (S116). In the case of that the slave photosensitive section has flaws, the device 10 records the address of the flaw of the master photosensitive section which is determined that it has flaws (S115), determines that the slave photosensitive section has flaws (S116), and can record the address of flaw of the slave photosensitive section which is determined that it has flaws (S118). COPYRIGHT: (C)2005,JPO&NCIPI |
