| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device which is provided with a test mode capable of testing a test block selected out of a plurality of circuit blocks, and can test the test block under a condition of voltage distribution nearly equal to its real working condition even when the device is in the test mode. SOLUTION: Shift registers SR_B and SR_C which operate in the test mode are formed in non-testing blocks B and C, by the use of flip-flops which operate ordinarily in an ordinary mode. Consequently, it becomes possible to operate blocks B and C while the test block A is tested, generate voltage drops in the blocks B and C, and obtain voltage distribution nearly equal to the ordinary mode (real working condition) in the test mode. Accordingly, it becomes possible to test the test block A regionally under a different distribution in voltage drop of the regions inside the semiconductor integrated circuit device. COPYRIGHT: (C)2005,JPO&NCIPI
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