| 摘要 |
PROBLEM TO BE SOLVED: To provide an ESD protection element which protects an LSI by turning on SCR operation in a very short time when a surge current is applied, forming a low-resistance discharge path for safety of circuit elements in the LSI, and discharging an electrostatic discharge current pulse therethrough to minimize the overshoot of a voltage. SOLUTION: The ESD protection element comprises a first P well region 2101 of a P conduction type formed in an insulating substrate, a first N well 2201 of an N conduction type surrounded by the first P well region 2101 to be directly contacted therewith, a P+ diffusion 2125 for fixing the reference potential of a cathode and a second N diffusion region (cathode) 2223 disposed in the first P well region 2101, a second P diffusion region (anode) 2123 of a P conduction type and a first N diffusion region 2221 of an N conduction type disposed in the first N well 2201. COPYRIGHT: (C)2005,JPO&NCIPI
|
