发明名称 ACQUISITION METHOD OF GAMMA CHARACTERISTIC, ACQUISITION SYSTEM OF GAMMA CHARACTERISTIC, AND PROJECTION SYSTEM
摘要 <P>PROBLEM TO BE SOLVED: To provide an acquisition method of gamma characteristic which is possible to achieve high precision considering effect of flare. <P>SOLUTION: The method includes a process S2 which photographs a calibration pattern projected from a image projection part, a process S3 which creates a flare influence reduction pattern for reducing effect of flare based on the image of the photographed calibration pattern, a process S4 which photographs the flare effect reduction pattern projected from an image projection means, and a process S5 which calculates gamma characteristic of the image projection part based on the image of the photographed flare effect reduction pattern. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004328627(A) 申请公布日期 2004.11.18
申请号 JP20030123956 申请日期 2003.04.28
申请人 OLYMPUS CORP 发明人 ISHII KENSUKE
分类号 G06T5/00;H04N1/407;H04N17/04 主分类号 G06T5/00
代理机构 代理人
主权项
地址