| 摘要 |
<P>PROBLEM TO BE SOLVED: To detect a failure in a test circuit other than scan test without increasing a circuit scale. <P>SOLUTION: A scanning controller of a semiconductor integrated circuit controlling execution of scanning test by a mode input signal and scan enable signal comprises a mode production circuit producing an operation mode signal from the mode input signal, an interrupt mode production circuit producing an interrupt mode signal independent of this, and a mode interrupt circuit for selecting a function mode signal or an interrupt mode signal and giving an internal operation mode of a semiconductor integrated circuit. The mode interrupt circuit selects the interrupt mode signal when the operation mode signal indicates the scanning test mode and scanning enable signal indicates a scanning capture operation, and select a operation mode signal in the other case. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
