发明名称 |
ACTIVE MATRIX PANEL INSPECTION DEVICE, INSPECTION METHOD, AND ACTIVE MATRIX OLED PANEL MANUFACTURING METHOD |
摘要 |
<p>Inspection of the function of a TFT array for the AMOLED panel is performed prior to the OLED formation step, thereby reducing the panel manufacturing cost. An active matrix OLED panel manufacturing method includes: an array step [1] for forming a TFT array on a substrate, thereby creating an active matrix panel; an inspection step [2] for inspecting the function of the active matrix panel created; and a cell step [3] for mounting an OLED on an active matrix panel which has been judged to be preferable in the inspection step [2]. In the inspection step [2], an opposing electrode is arranged in the vicinity of the surface where the OLED connection electrode is exposed in the active matrix panel created by the array step [1] and current flowing in the measurement object pixels constituting the active matrix panel is observed.</p> |
申请公布号 |
WO2004100110(A1) |
申请公布日期 |
2004.11.18 |
申请号 |
WO2004JP06235 |
申请日期 |
2004.04.28 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION;SAKAGUCHI, YOSHITAMI;NAKANO, DAIJU |
发明人 |
SAKAGUCHI, YOSHITAMI;NAKANO, DAIJU |
分类号 |
H01L21/77;H01L27/12;(IPC1-7):G09F9/00;H01L29/786;H05B33/14;H05B33/12;G01R31/00 |
主分类号 |
H01L21/77 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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