| 摘要 |
The invention relates to a phase plate (10), in particular for an electron microscope, comprising a ring electrode (20), which is configured as an annular plate with an opening that has a continuous external border and a fixing device (30), which comprises at least one support (31, 32, 33) that is mounted on the external border of the ring electrode (20) for positioning said electrode (20) in an optoelectronic beam. According to the invention, the fixing device (30) is configured without a central symmetry and for each support (31, 32, 33), there is no additional support located on the external border of the plate lying opposite to the centre of the opening. The invention also relates to an electron microscope that is equipped with the phase plate and to a method for reproducing a sample by means of electron microscopy. |
