Method for detecting defects in transparent materials

摘要

Detecting faults in transparent material includes irradiating definite partial volume of transparent material with first radiation source, coupling light of second radiation source into the transparent material, and detecting scattered light and bright field absorption from the fault in partial volume, and/or deflection of light of first radiation source by the fault in partial volume to detect the presence of fault in the partial volume. Detecting faults in transparent material includes irradiating definite partial volume of transparent material with a first radiation source; coupling light of second radiation source into the transparent material so that an optical path of light in the partial volume extends exclusively in interior of transparent material; and detecting scattered light and bright field absorption from the fault in partial volume, and/or deflection of light of first radiation source by the fault in partial volume to detect the presence of fault in partial volume of the transparent material. An independent claim is also included for an apparatus for carrying out the above method, comprising a first radiation source for illuminating a definite partial volume (2) of transparent material (3), a detector (4) for light originating from the partial volume, and a second radiation source (5) arranged in relation to the transparent material so that an associated optical path extends exclusively in an interior of transparent material.