发明名称 System and method for generating a shmoo plot by avoiding testing in failing regions
摘要 A method of testing an electrical device to determine a range of combinations of values of N variable operating parameters for which the device functions properly is described. In one embodiment, The method comprises defining a plot region comprising a plurality of operating points each corresponding to a particular combination of values of the N variable operating parameters, selecting an operating point within the plot region, testing the device using the combination of values of the N variable operating parameters corresponding to the selected operating point, and if the device functions in a first manner at the selected operating point, adding all operating points of the plot region having a first relationship with respect to the selected operating point to a list of operating points to be tested.
申请公布号 US6820027(B2) 申请公布日期 2004.11.16
申请号 US20020285774 申请日期 2002.11.01
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 WELLER CHRISTOPHER TODD
分类号 G01R31/317;G01R31/319;G01R31/3193;(IPC1-7):G06F15/04 主分类号 G01R31/317
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