发明名称 METHOD FOR CLEANING DEPOSITION CHAMBER FOR METAL OXIDE LAYER AND DEPOSITION APPARATUS FOR PERFORMING THE SAME REGARDIG TO RAPID ETCHING OF METAL OXIDE LAYER DEPOSITED IN DEPOSITION CHAMBER
摘要 PURPOSE: A method for cleaning a deposition chamber for a metal oxide layer is provided to clean a deposition chamber having a deposited metal oxide layer by an in-situ method while the deposition chamber is not open or separated, and to shorten an interval of cleaning time by rapidly etching the metal oxide layer deposited in the deposition chamber. CONSTITUTION: The metal oxide layer is deposited on the inner surface of the deposition chamber(10). The first RF(radio frequency) power is applied to the inside of the deposition chamber to relatively increase a plasma sheath potential in a portion of the deposition chamber where the metal oxide layer is relatively thick. Etch gas for etching the metal oxide layer is introduced to the deposition chamber to etch the metal oxide layer.
申请公布号 KR20040096380(A) 申请公布日期 2004.11.16
申请号 KR20030029452 申请日期 2003.05.09
申请人 INTEGRATED PROCESS SYSTEMS;SAMSUNG ELECTRONICS CO., LTD. 发明人 CHAE, SEUNG GI;JUN, YEONG SU;KIM, U SEOK;LEE, SANG GYU;LIM, HONG JU
分类号 H01L21/20;B08B7/00;C23C16/44;H01J37/32;(IPC1-7):H01L21/20 主分类号 H01L21/20
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