发明名称 Resist composition and patterning method
摘要 A resist composition is provided comprising a fluorochemical surfactant which functions to reduce the contact angle of a coating of the resist composition with water or an aqueous base developer as the amount of the fluorochemical surfactant increases. The resist composition forms a coating having a thickness uniformity, free of defects, and wettable with an aqueous base developer when applied onto a substrate, and has a good storage stability in that particles do not increase during storage in solution form.
申请公布号 US6818148(B1) 申请公布日期 2004.11.16
申请号 US19990401490 申请日期 1999.09.22
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 WATANABE SATOSHI;SAKURADA TOYOHISA;YANAGI YOSHITAKA;NAGURA SHIGEHIRO;ISHIHARA TOSHINOBU
分类号 C09K13/00;G03F7/00;G03F7/004;(IPC1-7):C09K13/00 主分类号 C09K13/00
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