发明名称 CIRCUIT FOR MEASURING DC(DIRECT CURRENT) CHARACTERISTIC OF INTERFACE INPUT/OUTPUT PAD REGARDLESS OF THE OPERATION OF INTERNAL LOGIC BLOCK
摘要 PURPOSE: A circuit for measuring a DC characteristic of an interface input/output pad is provided to set automatically an output mode and generate output data by selecting a measurement mode regardless of an operation of an internal logic block. CONSTITUTION: A data generation circuit(202) generates output data in response to one of a first control signal and a second control signal which are selectively received by a measurement mode. A first logic circuit(204) generates an output mode enable signal in response to one of the first and the second control signals. A second logic circuit(205) generates a third control signal and a fourth control signal in response to the output data and the output mode enable signal in response to the output data and the output mode enable signal. A switching circuit switches the current applied to an interface input/output pad in response to the third and the fourth control signals. A measurement unit measures the intensity of the current applied to the interface input/output pad.
申请公布号 KR20040095076(A) 申请公布日期 2004.11.12
申请号 KR20030028678 申请日期 2003.05.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YEO, SEONG GYO
分类号 G01R19/165;(IPC1-7):G01R19/165 主分类号 G01R19/165
代理机构 代理人
主权项
地址
您可能感兴趣的专利