发明名称 STENCIL MASK SUBSTRATE, STENCIL MASK, AND EXPOSURE METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a stencil mask blank and a stencil mask with stress optimally adjusted in the single-crystal silicon layer, in the manufacture of an SOI substrate-using stencil mask. <P>SOLUTION: In this stencil mask substrate comprising a supporting substrate composed of a single-crystal silicon wafer, a single-crystal silicon layer for pattern transfer, and an intermediate insulating film formed in between the supporting substrate and the single-crystal silicon layer, the impurity concentration level in the single-crystal silicon layer is established on the basis of the thickness of the intermediate insulating film. The stencil mask is provided with the impurity as phosphorus, and is manufactured out of the stencil mask substrate. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2004319742(A) 申请公布日期 2004.11.11
申请号 JP20030111312 申请日期 2003.04.16
申请人 TOPPAN PRINTING CO LTD 发明人 EGUCHI HIDEYUKI;KUROSU TOSHIAKI;ITOU KOUJIROU;TAMURA AKIRA
分类号 G03F1/20;G03F7/20;H01L21/027;(IPC1-7):H01L21/027;G03F1/16 主分类号 G03F1/20
代理机构 代理人
主权项
地址