发明名称 SEMICONDUCTOR MANUFACTURING EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To rapidly and accurately detect the temperature of a material at the time of processing in semiconductor manufacturing equipment. SOLUTION: A thermo-couple is built in a lifter pin 3 which lifts a material 10 placed on a test piece table 2. When detecting the temperature of the material 10 by the thermo-couple, the thermo-couple is moved toward the material 10 to bring the tip of the thermo-couple into contact with the bottom face of the material 10. A detection signal from the thermo-couple is transmitted to a temperature controller 4, and the temperature of the material 10 is controlled using a chiller 6 according to a control signal from the temperature controller 4. By bringing the tip of the thermo-couple built in the lifter pin 3 into direct contact with the material 10 at the time of detecting the temperature of the material 10, the temperature of the material can be rapidly and accurately detected to control the temperature to an appropriate value. The thermo-couple may be built in a clamp mechanism for fixing the material 10 on the test piece table or in a transfer arm. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004319723(A) 申请公布日期 2004.11.11
申请号 JP20030111034 申请日期 2003.04.16
申请人 FUJITSU LTD 发明人 KIKUCHI TOKUAKI
分类号 B65G49/07;H01L21/205;H01L21/3065;H01L21/677;H01L21/68;H01L21/683;(IPC1-7):H01L21/306 主分类号 B65G49/07
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