发明名称 |
Optoelectronic alignment controller for scanning geometrical lines and guiding a processing or machining tool or unit has an LED light source whose wavelength its optimized to match that of a detector |
摘要 |
<p>Optoelectronic alignment controller for scanning geometrical lines and guiding a processing or machining tool or unit in accordance with the sampled lines. The controller has a light source for illuminating the scanning region, in the form of a light emitting diode that has an intensity of at least 3000 milli Candela. The light output is focussed using a lens towards the scanning region. The optimum light yield wavelength of the diode corresponds to that of the optimum light yield wavelength of a light sensitive detector.</p> |
申请公布号 |
DE20309760(U1) |
申请公布日期 |
2004.11.11 |
申请号 |
DE2003209760U |
申请日期 |
2003.06.25 |
申请人 |
KOUKAL, ANTON |
发明人 |
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分类号 |
B23K9/127;B23Q3/18;B23Q17/24;B23Q35/128;B44B3/06;(IPC1-7):G05B19/42;G01B11/03 |
主分类号 |
B23K9/127 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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