发明名称 Method of determining the concavity and convexity on sample surface, and charged particle beam apparatus
摘要 A method and apparatus suitable for determining the concavity and convexity of line and space patterns formed on a sample. A profile is formed based on a charged-particle beam scan, the profile having a peak. When one foot portion of the peak converges more gradually than the other foot portion, a portion of the sample corresponding to the one foot portion is determined to be a convex portion. Alternatively, when one foot portion of the peak converges more steeply than the other foot portion, a portion of the sample corresponding to the one foot portion is determined to be a concave portion.
申请公布号 US2004222375(A1) 申请公布日期 2004.11.11
申请号 US20040779749 申请日期 2004.02.18
申请人 KIMURA YOSHIHIRO;KOMURO OSAMU;SASAJIMA FUMIHIRO 发明人 KIMURA YOSHIHIRO;KOMURO OSAMU;SASAJIMA FUMIHIRO
分类号 G01B15/04;G01B15/08;G01N23/225;H01J37/28;H01L21/027;H01L21/66;(IPC1-7):G01N23/225 主分类号 G01B15/04
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