发明名称 |
SEMICONDUCTOR STORAGE DEVICE HAVING SYNCHRONOUS AND ASYNCHRONOUS MODES |
摘要 |
A method for performing scan testing using a scan chain having a plurality of storage elements is described. During a capture phase, each storage element of the scan chain stores data from a first data input of the storage element synchronously to a clock signal. And during a shift phase, a scan pattern is shifted into the scan chain in which each storage element stores data from a second data input of the storage element asynchronously with to the clock signal. |
申请公布号 |
US2016259001(A1) |
申请公布日期 |
2016.09.08 |
申请号 |
US201514638458 |
申请日期 |
2015.03.04 |
申请人 |
FREESCALE SEMICONDUCTOR, INC. |
发明人 |
CORSO JORGE;BARROS MARCOS C.;LUJAN ALEXANDRE S. |
分类号 |
G01R31/3177 |
主分类号 |
G01R31/3177 |
代理机构 |
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代理人 |
|
主权项 |
1. A method for performing scan testing using a scan chain having a plurality of storage elements, the method comprising:
during a capture phase, each storage element of the scan chain storing data from a first data input of the storage element synchronously with a clock signal; and during a shift phase, shifting a scan pattern into the scan chain in which each storage element stores data from a second data input of the storage element asynchronously with the clock signal. |
地址 |
AUSTIN TX US |