SEMICONDUCTOR MEMORY DEVICE CAPABLE OF ACCESSING ALL MEMORY CELLS BY RELATIVE ADDRESSING METHOD

摘要

PROBLEM TO BE SOLVED: To provide a semiconductor memory device, whose test time can be reduced by simultaneously testing a plurality of memory devices. SOLUTION: This semiconductor memory device is configured to access all the memory cells by utilizing only a part among address pins in a wafer level test mode, and a part of the address pins is used to receive the address signals from a tester. The received address signals are used not to specify the memory cell in the wafer level test mode, but to specify the shift distance (or jump distance) from the presently selected memory cell to the memory cell to be selected next. That is, this semiconductor memory device selects the memory cells using the relative address specifying method. COPYRIGHT: (C)2005,JPO&NCIPI