发明名称 |
FOREIGN MATTER INSPECTION METHOD AND DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To detect foreign matters by using a threshold which can be used on any background and does not make a detection error. SOLUTION: A set of data of the intensity of foreign matters and the threshold for detecting the foreign matters from a plurality of sample images is obtained in advance to calculate a regression curve and the following formula; threshold = coefficient×minimum intensity + offset. The threshold is determined based on the formula and is used as the threshold to threshold process the image for foreign matter inspection. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2004317431(A) |
申请公布日期 |
2004.11.11 |
申请号 |
JP20030114641 |
申请日期 |
2003.04.18 |
申请人 |
DENSO CORP |
发明人 |
DAITO AKIHIRO;KANEKO YASUHIRO;MUROZAKI TAKASHI;KURATANI KATSUMI;INA YOSHIO |
分类号 |
G01N21/88;F02M65/00;(IPC1-7):G01N21/88 |
主分类号 |
G01N21/88 |
代理机构 |
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地址 |
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