发明名称 FOREIGN MATTER INSPECTION METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To detect foreign matters by using a threshold which can be used on any background and does not make a detection error. SOLUTION: A set of data of the intensity of foreign matters and the threshold for detecting the foreign matters from a plurality of sample images is obtained in advance to calculate a regression curve and the following formula; threshold = coefficient×minimum intensity + offset. The threshold is determined based on the formula and is used as the threshold to threshold process the image for foreign matter inspection. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004317431(A) 申请公布日期 2004.11.11
申请号 JP20030114641 申请日期 2003.04.18
申请人 DENSO CORP 发明人 DAITO AKIHIRO;KANEKO YASUHIRO;MUROZAKI TAKASHI;KURATANI KATSUMI;INA YOSHIO
分类号 G01N21/88;F02M65/00;(IPC1-7):G01N21/88 主分类号 G01N21/88
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