发明名称 ULTRAVIOLET MEASURING METHOD AND ULTRAVIOLET MEASURING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method and a device capable of always measuring easily specific ultraviolet information relative to a specific working curve from a measured value measured by an ultraviolet receiving element having a spectral characteristic known beforehand. SOLUTION: In this ultraviolet measuring method, the measured value measured by the ultraviolet receiving element (step 100) is corrected based on a predicted value of the whole region predicted from spectral sensitivity of the ultraviolet receiving element and a solar spectral radiation spectrum and a predicted value of a specific region predicted from the specific working curve, the spectral sensitivity and the solar spectral radiation spectrum, to thereby acquire the specific ultraviolet information (step 102). The specific ultraviolet information relative to the specific working curve can be always measured easily and simply from the measured value by the ultraviolet receiving element having the spectral characteristic known beforehand in this way, and simultaneously the ultraviolet measuring method and this ultraviolet measuring device capable of measuring the total quantity of the ultraviolet rays can be acquired. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004317318(A) 申请公布日期 2004.11.11
申请号 JP20030112131 申请日期 2003.04.16
申请人 FUJI XEROX CO LTD 发明人 YAGI SHIGERU
分类号 G01J1/42;(IPC1-7):G01J1/42 主分类号 G01J1/42
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