发明名称 SPACE-SAVING TEST STRUCTURES HAVING IMPROVED CAPABILITIES
摘要 <p>A space-saving test structure includes a core metal line (112), at least one extrusion detection line (110, 114) and an extrusion monitoring segment (130). The core metal line (112) has a "non-linear configuration" and is capable of conducting current for an electromigration test, an isothermal test, and extrusion monitoring. The at least one extrusion detection line (110, 114) is situated adjacent to the core metal line (112). The extrusion monitoring segment (130) is electrically connected to the at least one extrusion detection line (110, 114). The extrusion monitoring segment (130) is adapted to determine whether an extrusion occurs in the core metal line (112) by measuring a resistance between the core metal line (112) and the at least one extrusion detection line (110, 114).</p>
申请公布号 WO2004097437(A1) 申请公布日期 2004.11.11
申请号 WO2004US12069 申请日期 2004.04.19
申请人 KIM, HYEON-SEAG;ADVANCED MICRO DEVICES, INC. 发明人 KIM, HYEON-SEAG
分类号 G01R31/28;(IPC1-7):G01R31/316 主分类号 G01R31/28
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