发明名称 POWER SUPPLY DETERIORATION JUDGING APPARATUS AND PROGRAM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an apparatus for judging the lifetime based on the use temperature of a power supply device. <P>SOLUTION: The apparatus is provide with a sensor that measures the use ambient temperature of the power supply device and an accumulated operation time counter that counts and records accumulated operation time corresponding to the use ambient temperature of the power supply device based on the measured value of the sensor. The apparatus judges the deterioration and the lifetime of the power supply device by using the counted value. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2004320870(A) 申请公布日期 2004.11.11
申请号 JP20030109812 申请日期 2003.04.15
申请人 TOACK CORP 发明人 RIKIMARU KEIJI;IWASA SADAYUKI;GO SHIMEI;HAMANO MITSURU
分类号 G06F1/28;H02H7/16;H02M3/00;(IPC1-7):H02H7/16 主分类号 G06F1/28
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